
 Generate File TITLE:   .
 Crystal Identifier:    ref-ldh2ow3_3



 *** WARNING *** No attempt will be made to measure overloaded reflections
 Use keywords PROFILE OVERLOAD to estimate overloads by profile fitting
 IMAGE    CCX    CCY    CCOM   DIST YSCALE  TILT TWIST   ROFF   TOFF  RESID  WRESID    FULL   PART   OVRL  NEG  BAD  I/SIGI  I/SIGI   Rsym  Nsym SDRAT
                                                                                                             overall (at 1.1A)


 *** Warning messages ***

 *** SERIOUS PROBLEMS ***
 ========================
 The following problems may have a significant effect on data quality
 Action should be taken to eliminate these warnings.


 *** PROBLEMS WORTH CONSIDERING ***
 ==================================
 The following warnings suggest that the processing might be improved
 if appropriate action is taken.


 POOR PROFILES IN SOME AREAS
 ===========================
 For 13 profiles the correlation coefficient with the central profile is less than 0.5.
 Smallest correlation coefficient is  0.00
 Possible reasons are:
 1) Very weak diffraction (consider cutting back the resolution)
 2) Errors in cell parameters (check DELX, DELY for the standard profiles).
 3) Genuine variation due to high obliquity (for example).
 4) Presence of zingers or spots from an ice or salt crystal which are much
 stronger than the protein spots. Sometimes these can be rejected using
 the PROFILE CUTOFF keywords.

 A low correlation does NOT necessarily mean that the processing needs to be changed.

 The image number, profile box number and correlation coefficient for
 up to the first 6 occurences are:
   ID BOX CORRLN     ID BOX CORRLN     ID BOX CORRLN     ID BOX CORRLN   
    1   1   0.00      1   2   0.00      1   3   0.00      1   4   0.00
    1   5   0.00      1   6   0.00
 $TABLE: Refined detector parameters:
 $GRAPHS :Camera constants CCX CCY (mm) CCOM (deg) v image:A:1,2,3,4:  
 :Distance (mm) v image:A:1,5:
 :Yscale v image:A:1,6:
 :Tilt and twist (hundredths of deg) v image:A:1,7,8:
 :ROFF and TOFF (mm) v image:A:1,9,10:
 :Positional error (mm) and weighted error v image:A:1,11,12:
 :I/sig(I) overall and outer v image:N:1,18,19:
 :Rsym v image:N:1,20:  
 :SDratio v image:N:1,22:  
 :Number of overloads and badspots v image:A:1,15,17: $$
 IMAGE    CCX    CCY    CCOM   DIST YSCALE  TILT TWIST   ROFF   TOFF  RESID  WRESID    FULL   PART   OVRL  NEG  BAD I/sigI I/sigI_out  Rsym  Nsym SDRAT $$ $$
 $$
  $TABLE: Post refinement:
 $GRAPHS :Missets phix phiy phiz v image:A:1,2,3,4:  
 :Cell parameters A,B,C v image:A:1,5,6,7:  
 :Cell angles alpha beta gamma v image:A:1,8,9,10:  
 :Mosaic spread v image:A:1,11:  
 :Beam divergences v image:A:1,12,13: $$  
 Image     PHIX     PHIY     PHIZ        A        B        C      ALPHA     BETA    GAMMA   MOSAIC   DIVH   DIVV    Resid      NR $$ $$
 $$
